Showing items 1 - 2 of 2

Applied Time Series Analysis: STS 502

- Ndege, J O, De Waal, P J

  • Authors: Ndege, J O , De Waal, P J
  • Date: 2011-06
  • Language: English
  • Type: Examination paper
  • Identifier: vital:11973 , http://hdl.handle.net/10353/d1010337
  • Description: Applied Time Series Analysis: STS 502, Honours examinatino June 2011.
  • Full Text: false

Random Effects Modeling: STS 505

- Chiruka, R, De Waal, P J

  • Authors: Chiruka, R , De Waal, P J
  • Date: 2010-11
  • Language: English
  • Type: Examination paper
  • Identifier: vital:11977 , http://hdl.handle.net/10353/d1010342
  • Description: Random Effects Modeling: STS 505, Honours examination November 2010.
  • Full Text: false
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